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Author (up) Grevin, B.; Schwartz, P.O.; Biniek, L.; Brinkmann, M.; Leclerc, N.; Zaborova, E.; Mery, S. openurl 
  Title High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor-acceptor dyads Type Journal Article
  Year 2016 Publication Beilstein Journal Of Nanotechnology Abbreviated Journal Beilstein J. Nanotechnol.  
  Volume 7 Issue Pages 799-808  
  Keywords donor-acceptor co-oligomers; donor-acceptor lamellae; donor-acceptor-ordered bulk heterojunction; Kelvin probe force; microscopy (KPFM); noncontact atomic force microscopy (nc-AFM); organic photovoltaics; surface photo-voltage (SPV)  
  Abstract Self-assembled donor-acceptor dyads are used as model nanostructured heterojunctions for local investigations by noncontact atomic force microscopy (nc-AFM) and Kelvin probe force microscopy (KPFM). With the aim to probe the photo-induced charge carrier generation, thin films deposited on transparent indium tin oxide substrates are investigated in dark conditions and upon illumination. The topographic and contact potential difference (CPD) images taken under dark conditions are analysed in view of the results of complementary transmission electron microscopy (TEM) experiments. After in situ annealing, it is shown that the dyads with longer donor blocks essentially lead to standing acceptor-donor lamellae, where the acceptor and donor groups are p-stacked in an edge-on configuration. The existence of strong CPD and surface photo-voltage (SPV) contrasts shows that structural variations occur within the bulk of the edge-on stacks. SPV images with a very high lateral resolution are achieved, which allows for the resolution of local photo-charging contrasts at the scale of single edge-on lamella. This work paves the way for local investigations of the optoelectronic properties of donor-acceptor supramolecular architectures down to the elementary building block level.  
  Address [Grevin, Benjamin] Univ Grenoble Alpes, INAC SPrAM, F-38000 Grenoble, France, Email:;  
  Corporate Author Thesis  
  Publisher Beilstein-Institut Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 2190-4286 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000377563200001 Approved no  
  Call Number Admin @ benzerara @ Serial 14036  
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