Institut Charles Sadron Equipements
Caracterisation
UV-Vis-NIR spectrophotometer Lambda 25
UV-Visible-Near IR spectrophotometer for routine applications (operating range : 190 - 1100 nm) equipped with sample hol
Fabrication
Dynamic tensile machine
Dynamic tensile machine (INSTRON ElectroPuls E3000 with load cells of 10N, 100N and 1kN) for mechanical test: tensile, c
Microscopy
Cryo fracture device
Preparation of Pt/C replica after cryopreparation and cryo fracturing under high vacuum
| Nom | Emplacement | Catégorie | Equipe | Responsable |
|---|---|---|---|---|
| Optical Tweezers | F142 | Microscopie | MCUBE | Stocco Antonio |
| Confocal Microscopy | F142 | Microscopie | MCUBE | Muller Pierre |
| RICM - Interference microscopy | F146 | Microscopie | MCUBE | Muller Pierre |
| Numerical microscope Keyence | B255 | Microscopie | INCA | Drenckhan Wiebke |
| ELMO glow discharge system | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Edwards Auto 306 Evaporator | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Polarized Light Microscope | G112 | Microscopie | PLAMICS | Carvalho Alain |
| Ion Milling System IM4000Plus | C129 | Microscopie | PLAMICS | Carvalho Alain |
| Scanning Electron Microscope | F134 | Microscopie | PLAMICS | Carvalho Alain |
| Cryo-SEM Preparation System | F134 | Microscopie | PLAMICS | Carvalho Alain |
| Sputter coater | G114 | Microscopie | PLAMICS | Carvalho Alain |
| Transmission electron microscope | G108 | Microscopie | PLAMICS | Schmutz Marc |
| cryologies holder | G108 | Microscopie | PLAMICS | Schmutz Marc |
| heating holder | G108 | Microscopie | PLAMICS | Schmutz Marc |
| Cryo fracture device | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Carbon coater under primary vacuum | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Freezing machine | G118 | Microscopie | PLAMICS | Schmutz Marc |
| Atomic Force Microscopy (AFM) | H0-30 | Microscopie | PLAMICS | Contal Christophe |