Institut Charles Sadron Equipements
Caracterisation
Surface Plasmon Resonance
This is an optical technique for measuring the mass and thickness of adsorbed polymer or molecule. It can also be used t
Fabrication
Glove box
GP campus 2*2 gloves with standard purification for doping of semi-conducting polymers and thermoelectric characterizati
| Nom | Emplacement | Catégorie | Equipe | Responsable |
|---|---|---|---|---|
| Optical Tweezers | F142 | Microscopie | MCUBE | Stocco Antonio |
| Confocal Microscopy | F142 | Microscopie | MCUBE | Muller Pierre |
| RICM - Interference microscopy | F146 | Microscopie | MCUBE | Muller Pierre |
| Numerical microscope Keyence | B255 | Microscopie | INCA | Drenckhan Wiebke |
| ELMO glow discharge system | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Edwards Auto 306 Evaporator | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Polarized Light Microscope | G112 | Microscopie | PLAMICS | Carvalho Alain |
| Ion Milling System IM4000Plus | C129 | Microscopie | PLAMICS | Carvalho Alain |
| Scanning Electron Microscope | F134 | Microscopie | PLAMICS | Carvalho Alain |
| Cryo-SEM Preparation System | F134 | Microscopie | PLAMICS | Carvalho Alain |
| Sputter coater | G114 | Microscopie | PLAMICS | Carvalho Alain |
| Transmission electron microscope | G108 | Microscopie | PLAMICS | Schmutz Marc |
| cryologies holder | G108 | Microscopie | PLAMICS | Schmutz Marc |
| heating holder | G108 | Microscopie | PLAMICS | Schmutz Marc |
| Cryo fracture device | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Carbon coater under primary vacuum | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Freezing machine | G118 | Microscopie | PLAMICS | Schmutz Marc |
| Atomic Force Microscopy (AFM) | H0-30 | Microscopie | PLAMICS | Contal Christophe |
| Confocal Microscope | F142 | Microscopie | PLAMICS | Carvalho Alain |
| Cryo Confocal Microscope | F138 | Microscopie | PLAMICS | Carvalho Alain |