Institut Charles Sadron Equipements
Caracterisation
4 Probes- Resistivity and Seebeck measurements
A Keithley 2634B sourcemeter and a Lab Assistant Semiprobe station are used for the 4-point probes resistivity and Seebe
Microscopy
Polarized Light Microscope
Upright microscope for polarization Leica DMRX Objectives 10x, 20x, 40x
| Nom | Emplacement | Catégorie | Equipe | Responsable |
|---|---|---|---|---|
| Optical Tweezers | F142 | Microscopie | MCUBE | Stocco Antonio |
| Confocal Microscopy | F142 | Microscopie | MCUBE | Muller Pierre |
| RICM - Interference microscopy | F146 | Microscopie | MCUBE | Muller Pierre |
| Numerical microscope Keyence | B255 | Microscopie | INCA | Drenckhan Wiebke |
| ELMO glow discharge system | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Edwards Auto 306 Evaporator | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Polarized Light Microscope | G112 | Microscopie | PLAMICS | Carvalho Alain |
| Ion Milling System IM4000Plus | C129 | Microscopie | PLAMICS | Carvalho Alain |
| Scanning Electron Microscope | F134 | Microscopie | PLAMICS | Carvalho Alain |
| Cryo-SEM Preparation System | F134 | Microscopie | PLAMICS | Carvalho Alain |
| Sputter coater | G114 | Microscopie | PLAMICS | Carvalho Alain |
| Transmission electron microscope | G108 | Microscopie | PLAMICS | Schmutz Marc |
| cryologies holder | G108 | Microscopie | PLAMICS | Schmutz Marc |
| heating holder | G108 | Microscopie | PLAMICS | Schmutz Marc |
| Cryo fracture device | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Carbon coater under primary vacuum | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Freezing machine | G118 | Microscopie | PLAMICS | Schmutz Marc |
| Atomic Force Microscopy (AFM) | H0-30 | Microscopie | PLAMICS | Contal Christophe |