Institut Charles Sadron Equipements
Caracterisation
4 Probes- Resistivity and Seebeck measurements
A Keithley 2634B sourcemeter and a Lab Assistant Semiprobe station are used for the 4-point probes resistivity and Seebe
Fabrication
Discover SP - Microwave reactor
Synthesis under pression in flasks from 5 to 125ml. Temperature maximum of 300°C with IR reader. Power up to 300 W (m
Microscopy
Ion Milling System IM4000Plus
The IM4000Plus Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider, undistorted
| Nom | Emplacement | Catégorie | Equipe | Responsable |
|---|---|---|---|---|
| Optical Tweezers | F142 | Microscopie | MCUBE | Stocco Antonio |
| Confocal Microscopy | F142 | Microscopie | MCUBE | Muller Pierre |
| RICM - Interference microscopy | F146 | Microscopie | MCUBE | Muller Pierre |
| Numerical microscope Keyence | B255 | Microscopie | MIM | Drenckhan Wiebke |
| ELMO glow discharge system | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Edwards Auto 306 Evaporator | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Polarized Light Microscope | G112 | Microscopie | PLAMICS | Carvalho Alain |
| Ion Milling System IM4000Plus | G114 | Microscopie | PLAMICS | Carvalho Alain |
| Scanning Electron Microscope | F134 | Microscopie | PLAMICS | Carvalho Alain |
| Cryo-SEM Preparation System | F134 | Microscopie | PLAMICS | Carvalho Alain |
| Sputter coater | G114 | Microscopie | PLAMICS | Carvalho Alain |